FreiTest

FreiTest (developed from PHAETON) is an ATPG (Automatic Test Pattern Generation) Framework based on SAT-Solving (Boolean Satisfiability Problem) and BMC (Bounded Model Checking). It generates Test Patterns and Software-Based Self-Tests (SBSTs) for synthesized circuits and is under active development. First results on achieved Fault Coverages have been published on the IEEE ETS2023 conference in Venice under the title "Constraint-Based Automatic SBST Generation for RISC-V Processor Families".